JESD22-A103C High Temperature Storage Life

JESD22-A103C.pdf

High Temperature Storage Life
JESD22-A103C
(Revision of JESD22-A103-B)
NOVEMBER 2004

1 Scope
The test is applicable for evaluation, screening, monitoring, and/or qualification of all solid state devices.
High Temperature storage test is typically used to determine the effect of time and temperature, under storage conditions, for thermally activated failure mechanisms of solid state electronic devices, including nonvolatile memory devices (data retention failure mechanisms). During the test elevated temperatures (accelerated test conditions) are used without electrical stress applied.
This test may be destructive, depending on Time, Temperature and Packaging (if any).